โจ About me
I am currently a Ph.D. candidate in Computer Science and Engineering at The Chinese University of Hong Kong (CUHK), starting Fall 2025, under the supervision of Prof. Tsung-Yi Ho, with additional guidance from Prof. Bei Yu. Prior to joining CUHK, I obtained my M.S. degree in Integrated Circuit Science and Engineering from Beihang University (BUAA), where I conducted research under the guidance of Prof. Wei Xing and Prof. Yue Zhang.
๐ฎ Research Interests
- Artificial Intelligence
- Electronic Design Automation (EDA)
- Statistical Machine Learning
๐ Education
- PhD Computer Science and Engineering
The Chinese University of Hong Kong - MEng Electronic Information
Beihang University - BSc Electrical Engineering and Automation
University of Jinan
๐ฅ News
- 2024.12: ย โจ I am featured on the official WeChat account and website of Beihang University. | [link]
- 2024.11: ย ๐ One paper has been accepted by DATE 2025!
- 2024.09: ย ๐ฏ I will pursue a PhD in Computer Science and Engineering (CSE) at CUHK in August next year!
- 2024.06: ย ๐ One paper has been accepted by ICCAD 2024!
- 2024.02: ย ๐ One paper has been accepted by DAC 2024!
- 2023.09: ย ๐ One paper has been accepted by ASP-DAC 2024!
- 2023.07: ย ๐ One paper has been accepted by ICCAD 2023!
- 2023.02: ย ๐ One paper has been accepted by DAC 2023!
๐ Publications
Conference Paper ๐
- [C1] DATE 2025 FUSIS: Fusing Surrogate Models and Importance Sampling for Efficient Yield Estimation, Yanfang Liu, Wei W. Xing. 2025 Design, Automation & Test in Europe Conference (DATE), Lyon, France, 2025.
- [C2] ICCAD 2024 Beyond the Yield Barrier: Variational Importance Sampling Yield Analysis, Yanfang Liu, Lei He, Wei W. Xing. 2024 43rd IEEE/ACM International Conference on Computer-Aided Design (ICCAD), New York, NY, USA.
- [C3] ASP-DAC 2024 CIS: Conditional Importance Sampling for Yield Optimization of Analog and SRAM Circuits, Yanfang Liu, Wei W. Xing. 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC), Incheon, Korea, Republic of, 2024.
- [C4] ICCAD 2023 (Best Paper Nomination) OPT: Optimal Proposal Transfer for Efficient Yield Optimization for Analog and SRAM Circuits, Yanfang Liu, Guohao Dai, Yuanqing Cheng, Wang Kang, Wei W. Xing. 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), San Francisco, CA, USA, 2023.
- [C5] DAC 2023 Seeking the yield barrier: High-dimensional sram evaluation through optimal manifold, Yanfang Liu, Guohao Dai, Wei W. Xing. 2023 60th ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, USA, 2023.
- [C6] DAC 2024 Every Failure Is A Lesson: Utilizing All Failure Samples To Deliver Tuning-Free Efficient Yield Evaluation, Wei W. Xing, Yanfang Liu, Weijian Fan, Lei He. 2024 61st ACM/IEEE Design Automation Conference (DAC). New York, NY, USA, 2024.
๐ Honors and Awards (Selected)
- 2024.10 National Scholarship (Master).
- 2023.10 National Scholarship (Master) (Top 1%).
- 2020.10 National Scholarship (Undergraduate) (Top 1%).
- 2024.11 Outstanding Masterโs Thesis Award.
- 2024.11 Beijing Outstanding Graduate.
- 2024.06 Top Ten Graduate Award (Highest Honor for Graduate Students at Beihang University).
- 2024.05 Huawei Scholarship.
- 2022.06 Outstanding Bachelorโs Thesis Award.
- 2020.12 Outstanding Student of Shandong Province.
๐ป Experiences
The Chinese University of Hong Kong (Shenzhen)
- 2025.02 - 2025.07, Research Assistant, supervised by Prof. Tinghuan Chen
Peer Reviewer
- 2025.05 IEEE/ACM TODAES