โจ About me
I am currently a Ph.D. candidate in Computer Science and Engineering at The Chinese University of Hong Kong (CUHK), starting Fall 2025, under the supervision of Prof. Tsung-Yi Ho, with additional guidance from Prof. Bei Yu. Prior to joining CUHK, I obtained my M.S. degree in Electronic Information from Beihang University (BUAA), where I conducted research under the guidance of Prof. Wei Xing and Prof. Yue Zhang.
๐ฎ Research Interests
- Design Space Exploration (DSE)
- Statistical Machine Learning
๐ฅ News
- 2026.05: ย ๐ AnalogVerifier has been accepted by ICML 2026!
- 2024.11: ย ๐ FUSIS paper has been accepted by DATE 2025!
- 2024.09: ย ๐ฏ I will pursue a PhD in Computer Science and Engineering (CSE) at CUHK in August next year!
- 2024.06: ย ๐ VIS has been accepted by ICCAD 2024!
- 2024.02: ย ๐ EFAIL has been accepted by DAC 2024!
- 2023.09: ย ๐ CIS has been accepted by ASP-DAC 2024!
- 2023.11: ย ๐โจ OPT received the Best Paper Nomination Award๐!
- 2023.07: ย ๐ OPT has been accepted by ICCAD 2023!
- 2023.02: ย ๐ OPTIMIS has been accepted by DAC 2023!
๐ Publications
Note: CCF-A CCF-B CCF-C
Conference Paper
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[C7] ICML 2026 Yanfang Liu, Mingjun Wang, Peng Xu, Rongliang Fu, Bei Yu, Tsung-Yi Ho. AnalogVerifier: A Neuro-Symbolic Framework for Analog Circuit Verification, International Conference on Machine Learning (ICML), Seoul, Jul. 6โ11, 2026.
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[C6] DATE 2025 Yanfang Liu, Wei W. Xing. FUSIS: Fusing Surrogate Models and Importance Sampling for Efficient Yield Estimation, 2025 Design, Automation & Test in Europe Conference (DATE), Lyon, France, 2025.
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[C5] ICCAD 2024 Yanfang Liu, Lei He, Wei W. Xing. Beyond the Yield Barrier: Variational Importance Sampling Yield Analysis, 2024 43rd IEEE/ACM International Conference on Computer-Aided Design (ICCAD), New York, NY, USA.
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[C4] ASP-DAC 2024 Yanfang Liu, Wei W. Xing. CIS: Conditional Importance Sampling for Yield Optimization of Analog and SRAM Circuits, 2024 29th Asia and South Pacific Design Automation Conference (ASP-DAC), Incheon, Korea, Republic of, 2024.
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[C3] ICCAD 2023 BPN Award๐ Yanfang Liu, Guohao Dai, Yuanqing Cheng, Wang Kang, Wei W. Xing. OPT: Optimal Proposal Transfer for Efficient Yield Optimization for Analog and SRAM Circuits, 2023 IEEE/ACM International Conference on Computer Aided Design (ICCAD), San Francisco, CA, USA, 2023.
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[C2] DAC 2023 Yanfang Liu, Guohao Dai, Wei W. Xing. Seeking the yield barrier: High-dimensional sram evaluation through optimal manifold, 2023 60th ACM/IEEE Design Automation Conference (DAC), San Francisco, CA, USA, 2023.
- [C1] DAC 2024 Wei W. Xing, Yanfang Liu, Weijian Fan, Lei He. Every Failure Is A Lesson: Utilizing All Failure Samples To Deliver Tuning-Free Efficient Yield Evaluation, 2024 61st ACM/IEEE Design Automation Conference (DAC). New York, NY, USA, 2024.
๐ Selected Honors and Awards
- 2024.10 National Scholarship (Master).
- 2023.10 National Scholarship (Master) (Top 1%).
- 2020.10 National Scholarship (Undergraduate) (Top 1%).
- 2024.11 Outstanding Masterโs Thesis Award.
- 2024.11 Beijing Outstanding Graduate.
- 2024.06 Top Ten Graduate Award
- 2022.06 Outstanding Bachelorโs Thesis Award.
- 2020.12 Outstanding Student of Shandong Province.
๐ Education
- PhD Computer Science and Engineering
The Chinese University of Hong Kong - MEng Electronic Information
Beihang University - BSc Electrical Engineering and Automation
University of Jinan
๐ป Experiences
The Chinese University of Hong Kong (Shenzhen)
- 2025.02 - 2025.07, Research Assistant, supervised by Prof. Tinghuan Chen
Peer Reviewer
- 2025.05 IEEE/ACM TODAES